Tool Loadport Purge (TLP)
Tool Loadport Purge (TLP) is designed to provide controlled N₂ or XCDA purging at semiconductor equipment load ports, helping maintain a controlled environment within the FOUP or SMIF Pod during wafer processing and material transfer. It can be integrated with existing load ports and AMHS operations to support improved contamination control and wafer protection. MFSG's TLP 1.0 is capable of reducing FOUP humidity to below 1% RH within an extremely short period of time.
Configurable Speed Purging
Easy Setup & Maintenance
Independent Control Board
Purge activated only when a carrier is present
GUI for real time status display and tool operation
Compatible with Multiple EAP Communication Protocols
Position check: Position sensor
Environment monitor: Temperature and humidity sensor
Flow control: Pressure gauge, Flow meter and Mass Flow Controller (MFC)